Bulletin of the American Physical Society
APS March Meeting 2019
Volume 64, Number 2
Monday–Friday, March 4–8, 2019; Boston, Massachusetts
Session V23: Low Temperature Instrumentation
2:30 PM–4:18 PM,
Thursday, March 7, 2019
BCEC
Room: 158
Sponsoring
Unit:
GIMS
Abstract: V23.00005 : Achieving µeV resolution in scanning tunneling spectroscopy at mK temperatures in Al-Al SIS junctions
3:18 PM–3:30 PM
Presenter:
Johannes Schwenk
(National Institute of Standards and Technology)
Authors:
Johannes Schwenk
(National Institute of Standards and Technology)
Sungmin Kim
(National Institute of Standards and Technology)
Julian Berwanger
(Institut für Experimentelle und Angewandte Physik, Universität Regensburg)
William G Cullen
(National Institute of Standards and Technology)
Steven R Blankenship
(National Institute of Standards and Technology)
Young Kuk
(Center for Quantum Nanoscience, Ewha Womans University, Seoul, Korea)
Franz J Giessibl
(Institut für Experimentelle und Angewandte Physik, Universität Regensburg)
Joseph A Stroscio
(National Institute of Standards and Technology)
[1] Song et al., RSI 81, 121101 (2010)
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