Bulletin of the American Physical Society
APS March Meeting 2019
Volume 64, Number 2
Monday–Friday, March 4–8, 2019; Boston, Massachusetts
Session H26: Advances in Scanned Probe Microscopy II: High Frequency, and Optical and Low Temperature Measurements
2:30 PM–5:06 PM,
Tuesday, March 5, 2019
BCEC
Room: 160B
Sponsoring
Unit:
GIMS
Abstract: H26.00001 : What limits time resolution in AFM?*
2:30 PM–3:06 PM
Presenter:
Peter Grutter
(McGill University)
Author:
Peter Grutter
(McGill University)
Our most recent advances in mechanically detecting ultrafast events will be presented. In particular, a non-linear optically induced polarization in a solid will directly lead to a force which can be detected by AFM with its intrinsic nanometer spatial resolution. I will show how one can mechanically measure a change in the sample response as a result of a delay time as short as 25 atto seconds between a pump and probe stimulation pulse on LiNbO3 or monolayers of MoSe2.
The realization of ultrafast AFM opens the door to understanding ultrafast electron dynamics on surfaces. As such, we are able to demonstrate that the lower limit of timing precision in mechanical detection in a pump-probe experiment is determined by the smallest detectable signal, and not, as might be expected, by the mechanical resonance frequency of the oscillator.
Work done in collaboration with Z. Schumacher, R. Rejali, R. Pachlatko, A. Spielhofer, Y. Miyahara, and D. Cooke
*Supported by NSERC, FRQNT and CFI
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