Bulletin of the American Physical Society
APS March Meeting 2019
Volume 64, Number 2
Monday–Friday, March 4–8, 2019; Boston, Massachusetts
Session C65: Biomaterials: Structure, Function, Design I
2:30 PM–5:18 PM,
Monday, March 4, 2019
BCEC
Room: 260
Sponsoring
Unit:
DBIO
Chair: Suzanne Kane, Haverford College
Abstract: C65.00010 : Optical characterization of nacre using hyperspectral imaging*
4:42 PM–5:18 PM
Presenter:
Mikhail A. Kats
(Electrical and Computer Engineering, University of Wisconsin - Madison)
Author:
Mikhail A. Kats
(Electrical and Computer Engineering, University of Wisconsin - Madison)
The average thickness (and variance) of the nacre layers can encode information, for example the ocean temparture at the time of formation. However, obtaining information about the layer thickness typically requires destructive methods involving preparing and imaging cross-sections, and can require many cross-sections to map an entire sample.
Here, we present a method that combines polarized hyperspectral imaging with thin-film modeling, that is capable of nondestructively mapping the thickness of nacre layers across an entire specimen.
This work was performed together with Jad Salman, Alireza Shahsafi, Chang-Yu Sun, Steve Weibel, Chris Draves, Michel Frising, Brad Gundlach, Yuzhe Xiao, Gabor Kemeny, and Pupa Gilbert.
*MK acknowledges funding through the Air Force Office of Scientific Research.
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