Monday, March 4, 2019
8:00AM - 8:36AM
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A23.00001: Single Atom Scale Manipulation of Matter by Scanning Transmission Electron Microscopy
Invited Speaker:
Stephen Jesse
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Monday, March 4, 2019
8:36AM - 8:48AM
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A23.00002: Automation of Atom-Scale Device Patterning using Machine Learning
Jeremiah Croshaw, Mohammad Rashidi, Kieran Mastel, Marcus Tamura, Hedieh Hosseinzadeh, Robert A Wolkow
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Monday, March 4, 2019
8:48AM - 9:00AM
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A23.00003: Reduced Damage Electron Microscopy with Conditional Sample Re-illumination
Akshay Agarwal, Yuri van Staaden, Vivek Goyal, Karl K Berggren
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Monday, March 4, 2019
9:00AM - 9:12AM
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A23.00004: In situ observation of Sb2S3 single crystal formation in glass by micro x-ray diffraction
Courtney Au-yeung, Camelia Stan, Nobumichi Tamura, Himanshu Jain, Volkmar R G Dierolf
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Monday, March 4, 2019
9:12AM - 9:24AM
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A23.00005: Characterization of stress induced by Si1-xGex in the active epitaxial film on a SOI substrate via Scanning Surface PhotoVoltage Microscopy.
James Slinkman, Daminda Dahanayaka, Philip Kaszuba, Leon Moszkowicz, Randall Wells, Lloyd Bumm
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Monday, March 4, 2019
9:24AM - 9:36AM
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A23.00006: Artificial Neural Networks for Analysis of Coherent X-Ray Diffraction Images
Daniel Abarbanel, Mark Sutton, Hong Guo
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Monday, March 4, 2019
9:36AM - 9:48AM
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A23.00007: 2-beam action spectroscopy for probing multiphoton absorption processes in semiconductors
Nikolaos Liaros, Daniel Jovinelli, John T Fourkas
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Monday, March 4, 2019
9:48AM - 10:00AM
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A23.00008: High-Resolution Localization with Arbitrary Point Spread Functions
Rohan Parab, Craig Snoeyink
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Monday, March 4, 2019
10:00AM - 10:12AM
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A23.00009: Development of in-situ RF-enabled high-brightness femtosecond electron microscopy for complex material research
Shuaishuai Sun, Xiaoyi Sun, Daniel Bartles, Elliot D Wozniak, Joseph Williams, Faran Zhou, Nelson Sepulveda, Chong-yu Ruan
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