APS March Meeting 2018
Volume 63, Number 1
Monday–Friday, March 5–9, 2018;
Los Angeles, California
Session R40: 2D Materials - Electronic Structure and Transport
8:00 AM–10:48 AM,
Thursday, March 8, 2018
LACC
Room: 501C
Sponsoring
Unit:
DMP
Chair: Marc Bockrath, Ohio State University
Abstract ID: BAPS.2018.MAR.R40.1
Abstract: R40.00001 : Vertical Tunneling in Layered Materials and Its Applications*
8:00 AM–8:36 AM
Abstract
Author:
Huili (Grace) Xing
(Cornell Univ)
Tunneling has to play an essential role in vertical transport in layered
materials due to the van der Waals coupling between layers. The van der
Waals gap can be viewed as the thinnest insulator, with a physical thickness
of about 3-5 angstrom measured from the center of the nearest atomic planes
separated by the van der Waals gap (not the centroid of a monolayer). When
an electron wavelet moves perpendicular to this gap, is it sufficient to use
the transfer-Hamiltonian method to calculate the time it takes thus
calculating the magnitude of the resulting current flow? Is it possible to
control tunneling with an applied electric field thus possible to generate a
signal? Being one of the most sensitive transport mechanisms, it is
difficult to reach very high tunneling current density. In resonant
tunneling diodes, very high tunneling peak currents are achieved
(\textasciitilde MA/cm$^{\mathrm{2}})$; however, the valley current
increases concurrently, thus limiting the range of tunable tunneling current
to a typical value of \textless 5. Finally, how is tunneling in layered
materials different from 3D materials? These are the questions our group has
aimed to answer [1-8]. In this talk, I will share our progress and the
challenges we face in terms of preparing, characterizing these layered
materials as well as pursuing their applications.
\begin{enumerate}
\item Mingda (Oscar) Li, Huili Grace Xing et al. \textit{Single particle transport in two-dimensional heterojunction interlayer tunneling field effect transistor}. J. Appl. Phys. 115, 074508 (2014). doi:10.1063/1.4866076
\item Shudong Xiao, Mingda Li,~Alan Seabaugh, Debdeep Jena,~Huili Grace Xing. \textit{Vertical heterojunction of MoS2 and WSe2.} IEEE Device Research Conference, University of California, Santa Barbara, June 2014.
\item Debdeep Jena,~Mingda Li,~Nan Ma, Wan Sik Hwang, David Esseni, Alan~Seabaugh, and~Huili Grace Xing. \newline
\textit{Electron transport in 2D crystal semiconductors and their device applications.} IEEE Silicon Nanoelectronics Workshop, Hawaii, June 2014.
\item Rusen Yan, Huili Grace Xing et al.,~\textit{Esaki diodes in van der Waals heterojunctions with broken-gap energy band alignment}.~Nano Letters, 15(9), 5791-8, (2015). DOI: 10.1021/acs.nanolett.5b01792
\item Mingda (Oscar) Li, David Esseni, Gregory Snider, Debdeep Jena and~Huili Grace Xing.~\textit{Two-dimensional heterojunction interlayer tunneling field effect transistors (Thin-TFET)}~IEEE J-EDS, 3(3), 200-207 (2015). DOI:10.1109/JEDS.2015.2390643
\item ~Mingda (Oscar) Li, Rusen Yan, Debdeep Jena and Huili Grace Xing. \textit{Two-dimensional Heterojunction Interlayer Tunnel Field Effect Transistor (Thin-TFET): From Theory to Applications.} IEDM, pp.19.2/1-4, (2016)
\item Mingda (Oscar) Li, Ozan Irsoy, Claire Cardie, and Huili Grace Xing. \textit{Physics-inspired neural networks (Pi-NN) for efficient device compact modeling.} IEEE J. of Exploratory Solid-State Computational Devices and Circuits (2016).
\item Jimy Encomendero, Faiza Afroz Faria, S. M. Islam, Vladimir Protasenko, Sergei Rouvimov, Berardi Sensale-Rodriguez, Patrick Fay, Debdeep Jena, and Huli Grace Xing. \textit{New tunneling features in polar III-nitride resonant tunneling diodes.} Physics Review X (PRX), 7,041017 (2017).~ DOI: 10.1103/PhysRevX.7.041017
\end{enumerate}
*This work was supported in part by the Center for Low EnergySystems Technology (LEAST), one of six centers of STARnet, aSemiconductor Research Corporation program sponsored byMARCO and DARPA. This work made use of the Cornell Center forMaterials Research
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.MAR.R40.1