Bulletin of the American Physical Society
APS March Meeting 2018
Volume 63, Number 1
Monday–Friday, March 5–9, 2018; Los Angeles, California
Session R17: Graphene and Topological Insulator Surfaces
8:00 AM–10:48 AM,
Thursday, March 8, 2018
LACC
Room: 306A
Sponsoring
Units:
DCMP DMP
Chair: James Williams, University of Maryland, College Park
Abstract ID: BAPS.2018.MAR.R17.3
Abstract: R17.00003 : STM Study of Draped and Wrinkled Graphene*
8:24 AM–8:36 AM
Presenter:
Riju Banerjee
(Physics, Pennsylvania State University)
Authors:
Riju Banerjee
(Physics, Pennsylvania State University)
Lavish Pabbi
(Physics, Pennsylvania State University)
Bill Dusch
(Physics, Pennsylvania State University)
Anna Snelgrove
(Physics, Pennsylvania State University)
Tomotaroh Granzier-Nakajima
(Physics, Pennsylvania State University)
Mauricio Terrones
(Physics, Pennsylvania State University)
Eric Hudson
(Physics, Pennsylvania State University)
Understanding the mechanical properties of materials is one of the oldest branches of physics. After studying bulk materials for centuries, with the discovery of graphene, it was soon realized that strained 2D materials would deform significantly more than their bulk counterparts. Furthermore, the demonstration of Landau Levels in strained graphene opened up the field of manipulating electronic states by exploiting its mechanical properties. Despite initial ebullience, the field of strained 2D materials still lingers in its infancy as engineering strain and studying mechanical properties at the nanoscale remains a challenge.
Here we present results from STM investigations of graphene strained by two methods: draped over large (up to ~35nm) Cu step edges, and wrinkled by differential thermal contraction between the graphene and the Cu substrate. Our results provide insights into understanding the mechanical properties of 2D films required to directly strain engineer these systems.
*This material is based upon work supported by the National Science Foundation under Grant No. 1229138
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.MAR.R17.3
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