High-Resolution Spatial and Temporal Probing of Dynamically-Compressed Silicon using X-Ray Diffraction and Imaging*

We present the results of tunable x-ray temporal and spatial probing of silicon under laser-driven compression at the Matter in Extreme Conditions hutch of the Linac Coherent Light Source. Using simultaneous x-ray diffraction and x-ray contrast imaging diagnostics, we identify the influence of pressure on the multiple-shockwave sequence of compression, phase transition, and melt, and we compare our in-situ, dynamic results to previous static compression data and Hugoniot relations. We examine simulated and observed mechanisms for relieving high material strains ahead of plastic deformation and discuss the kinetics of multiple-shockwave formation and propagation. Lastly, we outline future work using the upgraded 60 J, high-power laser at the MEC hutch.