Bulletin of the American Physical Society

APS March Meeting 2018

Volume 63, Number 1

Monday–Friday, March 5–9, 2018; Los Angeles, California

Session Index

Session K01: Advances in Scanned Probe Microscopy III	Show Abstracts
Sponsoring Units: GIMS Chair: Fereshte Ghahari, NIST/University of Maryland, College Park Room: LACC 150A

Wednesday, March 7, 2018 8:00AM - 8:12AM		K01.00001: Charge Fluctuations in Pairs of Silicon Dangling Bonds Thomas Dienel, Wyatt Vine, Mohammad Rashidi, Lucian Livadaru, Jacob Retallick, Taleana Huff, Konrad Walus, Robert Wolkow
Wednesday, March 7, 2018 8:12AM - 8:24AM		K01.00002: Lateral Manipulation of Single Electrons within Atom-Defined Nanostructures via nc-AFM Wyatt Vine, Mohammad Rashidi, Thomas Dienel, Lucian Livadaru, Jacob Retallick, Taleana Huff, Konrad Walus, Robert Wolkow
Wednesday, March 7, 2018 8:24AM - 8:36AM		K01.00003: Single molecule measurements of fully quantum redox reactions at metal-molecule interface Yoichi Miyahara, Antoine Roy-Gobeil, Kirk Bevan, Peter Grutter
Wednesday, March 7, 2018 8:36AM - 8:48AM		K01.00004: Scanning diamond NV center probes compatible with conventional AFM technology Tony Zhou, Rainer Stohr, Amir Yacoby
Wednesday, March 7, 2018 8:48AM - 9:00AM		K01.00005: Quantum Force Measurements Using Macroscopic Molecular Tunneling Yi-Ting Chen, Dominik Rastawicki, Yang Liu, Hari Manoharan
Wednesday, March 7, 2018 9:00AM - 9:12AM		K01.00006: Development of low temperature scanning probe microscope for electrostatic force measurements on LaAlO₃/SrTiO₃ interface devices Aaveg Aggarwal, Venkat Chandrasekhar
Wednesday, March 7, 2018 9:12AM - 9:24AM		K01.00007: Effects of SQUID Alignment on Penetration Depth Measurements Irene Zhang, John Kirtley, Christopher Watson, Hilary Noad, Kathryn Moler
Wednesday, March 7, 2018 9:24AM - 9:36AM		K01.00008: Fabrication and Characterization of sub-100nm Pb SQUIDs for nanoscale SQUID-on-Tip Microscopy Avi Shragai, Marec Serlin, Charles Tschirhart, Martin Huber, Andrea Young
Wednesday, March 7, 2018 9:36AM - 9:48AM		K01.00009: Construction of a 4.2 K Scanning NanoSQUID-on-Tip Microscope Incorporating Topographic Feedback Charles Tschirhart, Marec Serlin, Avi Shragai, Jiacheng Zhu, Martin Huber, Andrea Young
Wednesday, March 7, 2018 9:48AM - 10:00AM		K01.00010: Scanning SQUID microscopy in a cryogen-free dilution refrigerator David Low, George Ferguson, Rachel Resnick, Brian Schaefer, Alexander Jarjour, Eric Smith, Katja Nowack
Wednesday, March 7, 2018 10:00AM - 10:12AM		K01.00011: Remote Bias Induced Electrostatic Force Microscopy for Subsurface Imaging Joseph Kopanski, Lin You, Yaw Obeng
Wednesday, March 7, 2018 10:12AM - 10:24AM		K01.00012: Subsurface imaging using tip generated stress and electric fields in atomic force microscopy Maria Cadena, Yuhang Chen, Ronald Reifenberger, Arvind Raman
Wednesday, March 7, 2018 10:24AM - 10:36AM		K01.00013: Optically Coupled Methods for Microwave Impedance Microscopy Scott Johnston, Eric Ma, Zhi-Xun Shen
Wednesday, March 7, 2018 10:36AM - 10:48AM		K01.00014: Direct Mapping of Localized Noise Sources in Monolayer MoS₂ Myungjae Yang, Tae-Young Kim, Takhee Lee, Seunghun Hong
Wednesday, March 7, 2018 10:48AM - 11:00AM		K01.00015: Simulations of atomic force microscopy image “flickering” on a doped Si (111) 7x7 surface using real-space pseudopotential calculations. Dingxin Fan, James Chelikowsky, Daniel Meuer, Franz Giessibl

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Bulletin of the American Physical Society

APS March Meeting 2018

Volume 63, Number 1

Monday–Friday, March 5–9, 2018; Los Angeles, California

Session Index

Session K01: Advances in Scanned Probe Microscopy III

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