Bulletin of the American Physical Society
APS March Meeting 2018
Volume 63, Number 1
Monday–Friday, March 5–9, 2018; Los Angeles, California
Session H11: Dopants and Defects in Semiconductors - 2D, Nano, and Novel Materials
2:30 PM–5:30 PM,
Tuesday, March 6, 2018
LACC
Room: 303A
Sponsoring
Units:
DMP DCOMP FIAP
Chair: Cyrus Dreyer, Rutgers Univ
Abstract ID: BAPS.2018.MAR.H11.1
Abstract: H11.00001 : Engineering point and extended defects in transition metal dichalcogenides
2:30 PM–3:06 PM
Presenter:
Hannu-Pekka Komsa
(Department of Applied Physics, Aalto University)
Author:
Hannu-Pekka Komsa
(Department of Applied Physics, Aalto University)
In my talk, I will present the results from layered molybdenum dichalcogenides (MoS2, MoSe2, and MoTe2), where vacancy, substitutional, interstitial, and grain boundary defects are introduced by electron irradiation or by various chemical treatments. Due to the 2D nature, transmission electron microscopy and scanning tunneling microscopy imaging allows direct monitoring of formation and agglomeration of defects as well as of larger structural changes. First-principles calculations are used to provide microscopic insight into the energetics and kinetics of these processes. The gained understanding together with the computationally predicted defect properties can be used to guide future efforts in tailoring the 2D material properties via defect engineering.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.MAR.H11.1
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