Bulletin of the American Physical Society
APS March Meeting 2018
Volume 63, Number 1
Monday–Friday, March 5–9, 2018; Los Angeles, California
Session E11: Dopants and Defects in Semiconductors - Experimental techniques
8:00 AM–11:00 AM,
Tuesday, March 6, 2018
LACC
Room: 303A
Sponsoring
Units:
DMP DCOMP FIAP
Chair: Nicholas Jungwirth, Cornell Univ
Abstract ID: BAPS.2018.MAR.E11.11
Abstract: E11.00011 : Contactless mobility measurements using two-photon excitation and a terahertz probe
10:24 AM–10:36 AM
Presenter:
Jared Wahlstrand
(NIST -Natl Inst of Stds & Tech)
Authors:
Jared Wahlstrand
(NIST -Natl Inst of Stds & Tech)
Edwin Heilweil
(NIST -Natl Inst of Stds & Tech)
[1] M. C. Beard, G. M. Turner, and C. A. Schmuttenmaer, J. Phys. Chem. B 106, 7146 (2002).
[2] B. G. Alberding, W. R. Thurber, and E. J. Heilweil, J. Opt. Soc. Am. B 34, 1392 (2017).
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.MAR.E11.11
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