Bulletin of the American Physical Society
APS March Meeting 2018
Volume 63, Number 1
Monday–Friday, March 5–9, 2018; Los Angeles, California
Session E01: Advances in Scanned Probe Microscopy II
8:00 AM–11:00 AM,
Tuesday, March 6, 2018
LACC
Room: 150A
Sponsoring
Unit:
GIMS
Chair: Xi Chen, Tsinghua University
Abstract ID: BAPS.2018.MAR.E01.8
Abstract: E01.00008 : Ultrafast AFM: sub-femtosecond time resolution at the nanometer scale*
9:48 AM–10:00 AM
Presenter:
Peter Grutter
(McGill Univ)
Authors:
Peter Grutter
(McGill Univ)
Zeno Schumacher
(McGill Univ)
Rasa Rejali
(McGill Univ)
Raphael Pachlatko
(McGill Univ)
Andreas Spielhofer
(McGill Univ)
Yoichi Miyahara
(McGill Univ)
We experimentally demonstrated this by achieving picosecond time resolution with nc-AFM and ultrafast laser pulses in low temperature grown GaAs. In this presentation we will discuss our most recent advances, enabling sub-fs time resolution. Specifically, we developed an autocorrelation measurement for ultrashort laser pulses by force detection. A non-linear crystal is used to generate an electric field which follows the intensity of the impinging ultrashort laser pulse; we directly trace the emitted electric field with attosecond temporal, and nanometer spatial, resolution using our nc-AFM setup. As such, we are able to demonstrate that the lower limit of time resolution in AFM is solely given by the minimal time delay achievable by the optical setup and the thermal noise of the nc-AFM.
*NSERC, FRQNT, CFI and SNF
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.MAR.E01.8
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