Bulletin of the American Physical Society
APS March Meeting 2018
Volume 63, Number 1
Monday–Friday, March 5–9, 2018; Los Angeles, California
Session A01: Advances in Scanned Probe Microscopy I
8:00 AM–10:48 AM,
Monday, March 5, 2018
LACC
Room: 150A
Sponsoring
Unit:
GIMS
Chair: Joseph Stroscio, NIST
Abstract ID: BAPS.2018.MAR.A01.11
Abstract: A01.00011 : Applying and detecting tip-induced local strain on monolayer MoS2/graphite with scanning tunneling microscopy and inelastic electron tunneling spectroscopy*
10:24 AM–10:36 AM
Presenter:
Wonhee Ko
(Oak Ridge National Lab)
Authors:
Wonhee Ko
(Oak Ridge National Lab)
Saban Hus
(Oak Ridge National Lab)
Xufan Li
(Oak Ridge National Lab)
Tom Berlijn
(Oak Ridge National Lab)
Giang Nguyen
(Oak Ridge National Lab)
Kai Xiao
(Oak Ridge National Lab)
An-Ping Li
(Oak Ridge National Lab)
*This research was performed at the Center for Nanophase Materials Sciences which is a DOE Office of Science User Facility.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.MAR.A01.11
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