Single Nano-Particle Plasmons, Catalysis, and Substrate Engineering Studied with Synchrotron Infrared Nano-Spectroscopy*

Synchrotron infrared nano-spectroscopy (SINS) combines the low-noise, broadband, high spectral irradiance, and coherence of synchrotron infrared radiation with scattering type, scanning near-field optical microscopy (s-SNOM) to enable sensitive vibrational spectroscopy spanning the entire mid- and far-infrared regions with nanometer spatial resolution. This powerful combination empowers a qualitatively new form of nano-chemometric analysis. The Advanced Light Source (ALS) at Berkeley Lab operates two infrared beamlines with SINS instruments that are available to general users. Here, we highlight three studies. First, Johns et al.¹ use SINS to measure narrow plasmonic linewidths of single doped metal oxide nanocrystals. Second, Wu et al.² use SINS to measure chemical reactions on single particle gold and platinum catalysts, revealing site specific enhancement of reactivity. Finally, Gilbert et al.³ studied engineered localized strain to control VO₂ thin films and study them with SINS and x-ray microdiffraction.
[1] Johns, R.W., et al., Nature Commun. 7, 11583 (2016).
[2] Wu, C.-Y., et al., Nature 541, 511–515 (2017).
[3] Gilbert, S.N., et al., Phys. Rev. B 96, 161110(R) (2017).