Bulletin of the American Physical Society
APS March Meeting 2018
Volume 63, Number 1
Monday–Friday, March 5–9, 2018; Los Angeles, California
Session H36: 2D Materials - van der Waals Heterostructures II
2:30 PM–5:30 PM,
Tuesday, March 6, 2018
LACC
Room: 410
Sponsoring
Unit:
DCMP
Chair: Scott Schmucker, NIST
Abstract ID: BAPS.2018.MAR.H36.14
Abstract: H36.00014 : Electronic Thermal Conductance Measurement of Ultraclean Bilayer Graphene using Johnson Noise Thermometry*
5:06 PM–5:18 PM
Presenter:
Artem Talanov
(Harvard Univ)
Authors:
Artem Talanov
(Harvard Univ)
Jesse Crossno
(Harvard Univ)
Kemen Linsuain
(Harvard Univ)
Jonah Waissman
(Harvard Univ)
Marine Arino
(Harvard Univ)
Hugo Bartolomei
(Harvard Univ)
Takashi Taniguchi
(National Institute for Materials Science)
Kenji Watanabe
(National Institute for Materials Science)
Kin Chung Fong
(Raytheon BBN Technology)
Philip Kim
(Harvard Univ)
*NDSEG, FAME Center sponsored by SRC MARCO and DARPA
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.MAR.H36.14
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