Bulletin of the American Physical Society
APS March Meeting 2017
Volume 62, Number 4
Monday–Friday, March 13–17, 2017; New Orleans, Louisiana
Session P28: Dopants and Defects in Semiconductors VII
2:30 PM–5:30 PM,
Wednesday, March 15, 2017
Room: 291
Sponsoring
Units:
DMP FIAP DCOMP
Chair: Joel Varley, Lawrence Livermore National Laboratory
Abstract ID: BAPS.2017.MAR.P28.5
Abstract: P28.00005 : Combining DFT, Cluster Expansions, and KMC to Model Point Defects in Alloys*
3:42 PM–3:54 PM
Preview Abstract Abstract
Authors:
N. A. Modine
(Sandia National Laboratories)
A. F. Wright
(Sandia National Laboratories)
S. R. Lee
(Sandia National Laboratories)
S. M. Foiles
(Sandia National Laboratories)
C. C. Battaile
(Sandia National Laboratories)
J. C. Thomas
(University of California, Santa Barbara)
A. Van der Ven
(University of California, Santa Barbara)
*Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration under Contract DE
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2017.MAR.P28.5
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