Bulletin of the American Physical Society
APS March Meeting 2017
Volume 62, Number 4
Monday–Friday, March 13–17, 2017; New Orleans, Louisiana
Session F52: Semiconducting QC: Charge Noise and Electrical Control
11:15 AM–2:15 PM,
Tuesday, March 14, 2017
Room: 399
Sponsoring
Unit:
GQI
Chair: Michael Stewart, NIST
Abstract ID: BAPS.2017.MAR.F52.14
Abstract: F52.00014 : Low frequency charge noise comparison in Si/SiO$_2$ and Si/SiGe quantum dots to assess suitability for quantum computing*
1:51 PM–2:03 PM
Preview Abstract Abstract
Authors:
Blake Freeman
(Univ of California - Los Angeles)
Joshua Schoenfield
(Univ of California - Los Angeles)
HongWen Jiang
(Univ of California - Los Angeles)
*This work is supported by U.S. ARO through Grant No. W911NF1410346.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2017.MAR.F52.14
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