Bulletin of the American Physical Society
APS March Meeting 2017
Volume 62, Number 4
Monday–Friday, March 13–17, 2017; New Orleans, Louisiana
Session F52: Semiconducting QC: Charge Noise and Electrical Control
11:15 AM–2:15 PM,
Tuesday, March 14, 2017
Room: 399
Sponsoring
Unit:
GQI
Chair: Michael Stewart, NIST
Abstract ID: BAPS.2017.MAR.F52.11
Abstract: F52.00011 : Testing of a bottom-up approach for electrically contacting nanoscale quantum electronic devices
1:15 PM–1:27 PM
Preview Abstract Abstract
Authors:
Aruna Ramanayaka
(National Institute of Standards and Technology)
Hyun-Soo Kim
(University of Maryland, National Institute of Standards and Technology)
Ke Tang
(University of Maryland, National Institute of Standards and Technology)
M. D. Stewart, Jr.
(National Institute of Standards and Technology)
J. M. Pomeroy
(National Institute of Standards and Technology)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2017.MAR.F52.11
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