Bulletin of the American Physical Society
APS March Meeting 2017
Volume 62, Number 4
Monday–Friday, March 13–17, 2017; New Orleans, Louisiana
Session E28: Dopants and Defects in Semiconductors III: Complex Oxides
8:00 AM–11:00 AM,
Tuesday, March 14, 2017
Room: 291
Sponsoring
Units:
DMP FIAP DCOMP
Chair: Matthew McCluskey, Washington State University
Abstract ID: BAPS.2017.MAR.E28.6
Abstract: E28.00006 : P-type hole mobility measurement in Na-doped BaSnO$_{\mathrm{\mathbf{3}}}$*
9:24 AM–9:36 AM
Preview Abstract
Abstract
Authors:
Sungyun Hong
(Seoul Natl Univ)
Yeaju Jang
(Seoul Natl Univ)
Jisung Park
(Seoul Natl Univ)
Kookrin Char
(Seoul Natl Univ)
*Samsung science and technology foundation
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2017.MAR.E28.6
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