Bulletin of the American Physical Society
APS March Meeting 2015
Volume 60, Number 1
Monday–Friday, March 2–6, 2015; San Antonio, Texas
Session W17: Focus Session: Graphene Devices: Function, Fabrication, and Characterization: Graphene Surface Characterization
2:30 PM–5:18 PM,
Thursday, March 5, 2015
Room: 102AB
Sponsoring
Unit:
DMP
Chair: Doron Naveh, Bar-Ilan University
Abstract ID: BAPS.2015.MAR.W17.1
Abstract: W17.00001 : High Resolution Imaging of Graphene on SiC by Contact Resonance AFM: Experiment and Theory
2:30 PM–2:42 PM
Preview Abstract Abstract
Authors:
Qing Tu
(Department of Mechanical Engineering and Materials Science, Duke University, Durham, NC, USA)
Bjoern Lange
(Department of Mechanical Engineering and Materials Science, Duke University, Durham, NC, USA)
Joao Marcelo Lopes
(Paul-Drude-Institut f\"ur Festk\"orperelektronik, Hausvogteiplatz 5-7, D-10117 Berlin, Germany)
Stefan Zauscher
(Department of Mechanical Engineering and Materials Science, Duke University, Durham, NC, USA)
Volker Blum
(Department of Mechanical Engineering and Materials Science, Duke University, Durham, NC, USA)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2015.MAR.W17.1
Follow Us |
Engage
Become an APS Member |
My APS
Renew Membership |
Information for |
About APSThe American Physical Society (APS) is a non-profit membership organization working to advance the knowledge of physics. |
© 2024 American Physical Society
| All rights reserved | Terms of Use
| Contact Us
Headquarters
1 Physics Ellipse, College Park, MD 20740-3844
(301) 209-3200
Editorial Office
100 Motor Pkwy, Suite 110, Hauppauge, NY 11788
(631) 591-4000
Office of Public Affairs
529 14th St NW, Suite 1050, Washington, D.C. 20045-2001
(202) 662-8700