Wednesday, March 4, 2015
11:15AM - 11:51AM
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M21.00001: Measurement and Instrumentation Challenges at X-ray Free Electron Lasers
Invited Speaker:
Yiping Feng
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Wednesday, March 4, 2015
11:51AM - 12:27PM
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M21.00002: TBD
Invited Speaker:
Alan Tennant
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Wednesday, March 4, 2015
12:27PM - 12:39PM
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M21.00003: LCLS-II: Upgrade Plans for the Linac Coherent Light Source--Including New Scientific Opportunities
William Schlotter
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Wednesday, March 4, 2015
12:39PM - 12:51PM
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M21.00004: Fourier transform inelastic x-ray scattering from phonons using Free Electron Laser pulses
Mariano Trigo, Thomas Henighan, David Reis
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Wednesday, March 4, 2015
12:51PM - 1:03PM
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M21.00005: ABSTRACT WITHDRAWN
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Wednesday, March 4, 2015
1:03PM - 1:15PM
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M21.00006: A MEMS-based device used for alignment and manipulation of MLL x-ray focusing optics
Weihe Xu, Kenneth Lauer, Hui Yan, Veljko Millanovic, Evgeny Nazaretski
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Wednesday, March 4, 2015
1:15PM - 1:27PM
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M21.00007: Forbidden Reflections in X-ray Crystal Truncation Rods: Using Surface Reference Waves to Distinguish Charge and Vibrational Asymmetry in Bulk Silicon
Jesse Kremenak, Yiyao Chen, Shawn Hayden, Michael Gramlich, Paul Miceli
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Wednesday, March 4, 2015
1:27PM - 1:39PM
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M21.00008: Phonon Mapping in Flowing Equilibrium
J.P.C. Ruff
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Wednesday, March 4, 2015
1:39PM - 1:51PM
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M21.00009: Nanoparticle twinning observed using correlated x-ray scattering at a free electron laser
Derek Mendez, Herschel Watkins, Daniel Ratner, Gundolf Schenk, Sebastian Doniach
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Wednesday, March 4, 2015
1:51PM - 2:03PM
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M21.00010: Mapping of Strain Inhomogeneity within a Single Ni-NiO Core-Shell Nanoparticle using Bragg Coherent Diffraction Imaging
Erandi Wijerathna, R. Harder, J. Clark, B. Kiefer, E. Fullerton, O. Shpyrko, E. Fohtung
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Wednesday, March 4, 2015
2:03PM - 2:15PM
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M21.00011: Measurement of fast dynamic strain generated by focusing of surface acoustic waves
Uday Singh, Y. Li, D.A. Walko, S. Adenwalla
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