Bulletin of the American Physical Society
APS March Meeting 2015
Volume 60, Number 1
Monday–Friday, March 2–6, 2015; San Antonio, Texas
Session L21: Focus Session: Advances in Scanned Probe Microscopy III: Novel Spectroscopic and Imaging Measurements
8:00 AM–11:00 AM,
Wednesday, March 4, 2015
Room: 201
Sponsoring
Unit:
GIMS
Chair: Jonathan Wyrick, National Institute of Standards and Technology
Abstract ID: BAPS.2015.MAR.L21.7
Abstract: L21.00007 : Chiral Enhanced Phonon Excitations in Inelastic Electron Tunneling Spectroscopy of Graphene*
9:12 AM–9:48 AM
Preview Abstract Abstract
Author:
Fabian Donat Natterer
(NIST, Center for Nanoscale Science and Technology)
*Collaborators: Y. Zhao*, J. Wyrick*, W. Y. Ruan**, Y-H. Chan**, M-Y. Chou**, N. B. Zhitenev*, J. A. Stroscio*: *NIST/CNST, **Georgia Tech, FDN appreciates funding from the SNF foundation under project no 148891
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2015.MAR.L21.7
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