Bulletin of the American Physical Society
APS March Meeting 2015
Volume 60, Number 1
Monday–Friday, March 2–6, 2015; San Antonio, Texas
Session B1: Focus Session: Graphene - Point Defects and Structural Defects
11:15 AM–2:15 PM,
Monday, March 2, 2015
Room: 001A
Sponsoring
Unit:
DMP
Chair: Benjamin Butz, Friedrich Alexander Universitaet Erlangen
Abstract ID: BAPS.2015.MAR.B1.13
Abstract: B1.00013 : Supercriticality of charge centers in graphene probed with scanning tunneling microscopy*
1:39 PM–1:51 PM
Preview Abstract Abstract
Authors:
Yuhang Jiang
(Rutgers University, Department of Physics and Astronomy, 136 Frelinghuysen Road, Piscataway, NJ 08855 USA)
Jinhai Mao
(Rutgers University, Department of Physics and Astronomy, 136 Frelinghuysen Road, Piscataway, NJ 08855 USA)
Guohong Li
(Rutgers University, Department of Physics and Astronomy, 136 Frelinghuysen Road, Piscataway, NJ 08855 USA)
D. Moldovan
(Departement Fysica, Universiteit Antwerpen Groenenborgerlaan 171, B-2020 Antwerpen, Belgium)
M. Ramezani Masir
(Departement Fysica, Universiteit Antwerpen Groenenborgerlaan 171, B-2020 Antwerpen, Belgium)
F. M. Peeters
(Departement Fysica, Universiteit Antwerpen Groenenborgerlaan 171, B-2020 Antwerpen, Belgium)
Eva Y. Andrei
(Rutgers University, Department of Physics and Astronomy, 136 Frelinghuysen Road, Piscataway, NJ 08855 USA)
*Work supported by DOE-FG02-99ER45742 and NSF DMR 1207108
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2015.MAR.B1.13
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