Bulletin of the American Physical Society
APS March Meeting 2015
Volume 60, Number 1
Monday–Friday, March 2–6, 2015; San Antonio, Texas
Session A21: Focus Session: Advances in Scanned Probe Microscopy I: Novel Approaches and Ultrasenstive Detection
8:00 AM–11:00 AM,
Monday, March 2, 2015
Room: 201
Sponsoring
Unit:
GIMS
Chair: Nikolai Zhitenev, National Institute of Standards and Technology
Abstract ID: BAPS.2015.MAR.A21.8
Abstract: A21.00008 : NC-AFM identification of different aluminum atoms on Al$_{2}$O$_{3}$/NiAl(110) surface*
9:48 AM–10:00 AM
Preview Abstract Abstract
Authors:
Ivan Stich
(Inst. of Physics, Slovak Academy of Siences)
Jan Brndiar
(Inst. of Physics, Slovak Academy of Siences)
Yan Jun Li
(Dept. of Appl. Phys., Osaka University)
Yasuhiro Sugawara
(Dept. of Appl. Phys., Osaka University)
*Supported by APVV-0207-11 and VEGA (2/0007/12) projects
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2015.MAR.A21.8
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