Thursday, March 6, 2014
2:30PM - 2:42PM
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W35.00001: Weak value amplification considered harmful
Christopher Ferrie, Joshua Combes
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Thursday, March 6, 2014
2:42PM - 2:54PM
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W35.00002: The information inequality in postselection on parameter estimation problems
Saki Tanaka, Naoki Yamamoto
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Thursday, March 6, 2014
2:54PM - 3:06PM
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W35.00003: Quantum Limits on Probabilistic Amplifiers
Shashank Pandey, Zhang Jiang, Joshua Combes, Carlton Caves
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Thursday, March 6, 2014
3:06PM - 3:18PM
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W35.00004: Optimal quantum-enhanced interferometry using a laser power source
Matthias Lang, Carlton Caves
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Thursday, March 6, 2014
3:18PM - 3:30PM
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W35.00005: Optimal phase estimation using photon number counting in the presence of dephasing noise
Kaushik Seshadreesan, Bhaskar RoyBardhan, Hwang Lee, Jonathan Dowling
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Thursday, March 6, 2014
3:30PM - 3:42PM
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W35.00006: Quantum process tomography of near-unitary maps
Amir Kalev, Charles Baldwin, Ivan Deutsch
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Thursday, March 6, 2014
3:42PM - 3:54PM
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W35.00007: Quantum process estimation via compressed sensing with convex optimization
Charles Baldwin, Amir Kalev, Ivan Deutsch
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Thursday, March 6, 2014
3:54PM - 4:06PM
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W35.00008: Compressed Sensing for Reconstructing Sparse Quantum States
Kenneth Rudinger, Robert Joynt
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Thursday, March 6, 2014
4:06PM - 4:18PM
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W35.00009: High-Confidence Quantum Gate Tomography
Blake Johnson, Marcus da Silva, Colm Ryan, Shelby Kimmel, Brian Donovan, Thomas Ohki
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Thursday, March 6, 2014
4:18PM - 4:54PM
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W35.00010: Robust Characterization of Quantum Processes
Invited Speaker:
Shelby Kimmel
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Thursday, March 6, 2014
4:54PM - 5:06PM
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W35.00011: Tomography via Correlation of Noisy Measurement Records
Colm Ryan, Blake Johnson, Jay Gambetta, Jerry Chow, Marcus Silva, Oliver Dial, Thomas Ohki
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Thursday, March 6, 2014
5:06PM - 5:18PM
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W35.00012: Simpler, faster, better: robust randomized benchmarking tests for non-unitality and non-Markovianity in quantum devices
Joel Wallman, Steve Flammia, Marie Barnhill, Joseph Emerson
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Thursday, March 6, 2014
5:18PM - 5:30PM
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W35.00013: Determining individual gate error models from the output of quantum error detection circuits
Austin Fowler, John Martinis
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