Bulletin of the American Physical Society
APS March Meeting 2014
Volume 59, Number 1
Monday–Friday, March 3–7, 2014; Denver, Colorado
Session G44: Focus Session: Defects in Semiconductors: Characterization
11:15 AM–2:15 PM,
Tuesday, March 4, 2014
Room: Mile High Ballroom 4C
Sponsoring
Units:
DMP FIAP
Chair: Yong Zhang, University of North Carolina at Charlotte
Abstract ID: BAPS.2014.MAR.G44.4
Abstract: G44.00004 : Optical and electrical manipulation of a single bi-stable Si-atom in GaAs
11:51 AM–12:03 PM
Preview Abstract Abstract
Authors:
Paul Koenraad
(Eindhoven University of Technology)
Erwin Smakman
(Eindhoven University of Technology)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2014.MAR.G44.4
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