Bulletin of the American Physical Society

APS March Meeting 2014

Volume 59, Number 1

Monday–Friday, March 3–7, 2014; Denver, Colorado

Session Index

Session G44: Focus Session: Defects in Semiconductors: Characterization	Show Abstracts
Sponsoring Units: DMP FIAP Chair: Yong Zhang, University of North Carolina at Charlotte Room: Mile High Ballroom 4C

Tuesday, March 4, 2014 11:15AM - 11:27AM		G44.00001: Angstrom resolved imaging of charge percolation through the interface between phosphorous doped crystalline silicon and silicon dioxide Kapildep Ambal, Philipp Rahe, Clayton C. Williams, Christoph Boehme Preview Abstract
Tuesday, March 4, 2014 11:27AM - 11:39AM		G44.00002: Imaging of the native inversion layer in Silicon-On-Insulator wafers via Scanning Surface Photovoltage: Implications for RF device performance Daminda Dahanayaka, Andrew Wong, Philip Kaszuba, Leon moszkowicz, James Slinkman Preview Abstract
Tuesday, March 4, 2014 11:39AM - 11:51AM		G44.00003: Investigating individual arsenic dopant atoms in silicon using low-temperature scanning tunnelling microscopy Neil Curson, Kitiphat Sinthiptharakoon, Steven Schofield, Philipp Studer, Veronika Brazdova, Cyrus Hirjibehedin, David Bowler Preview Abstract
Tuesday, March 4, 2014 11:51AM - 12:03PM		G44.00004: Optical and electrical manipulation of a single bi-stable Si-atom in GaAs Paul Koenraad, Erwin Smakman Preview Abstract
Tuesday, March 4, 2014 12:03PM - 12:15PM		G44.00005: Observation of the exciton in low-temperature-grown GaAs using four-wave mixing Daniel Webber, Luke Hacquebard, Murat Yildirim, Sam March, Reuble Mathew, Angela Gamouras, Xinyu Liu, Margaret Dobrowolska, Jacek Furdyna, Kimberley Hall Preview Abstract
Tuesday, March 4, 2014 12:15PM - 12:27PM		G44.00006: Evolution of transition metal dopant properties near the GaAs surface Anne Benjamin, Jay Gupta Preview Abstract
Tuesday, March 4, 2014 12:27PM - 1:03PM		G44.00007: Sub-surface minority carrier lifetime mapping in photovoltaic materials Invited Speaker: P. James Schuck Preview Abstract
Tuesday, March 4, 2014 1:03PM - 1:15PM		G44.00008: Imaging Long-Range Carrier Diffusion Across Grains in Polycrystalline CdTe Kirstin Alberi, Brian Fluegel, Helio Moutinho, Ramesh Dhere, Jian Li, Angelo Mascarenhas Preview Abstract
Tuesday, March 4, 2014 1:15PM - 1:27PM		G44.00009: Atomic-resolution study of dislocation structures and interfaces in poly-crystalline thin film CdTe using aberration-corrected STEM Tadas Paulauskas, Eric Colegrove, Chris Buurma, Moon Kim, Robert Klie Preview Abstract
Tuesday, March 4, 2014 1:27PM - 1:39PM		G44.00010: Defect Energy Levels in GaAsBi and GaAs Grown at Low Temperatures Patricia Mooney, Keelan Watkins, Zenan Jiang, Alberto Basile, Ryan Lewis, Vahid Bahrami-Yekta, Mostafa Masnadi-Shirazi, Daniel Beaton, Thomas Tiedje Preview Abstract
Tuesday, March 4, 2014 1:39PM - 1:51PM		G44.00011: A Single Molecule Approach to Defect Studies in ZnO N.R. Jungwirth, Y.Y. Pai, H.S. Chang, E.R. MacQuarrie, G.D. Fuchs Preview Abstract
Tuesday, March 4, 2014 1:51PM - 2:03PM		G44.00012: Room-Temperature Plasticity in ZrC: Role of Crystal Anisotropy Christian Ratsch, S. Kiani, A.M. Minor, S. Kodambaka, J.M. Yang Preview Abstract
Tuesday, March 4, 2014 2:03PM - 2:15PM		G44.00013: Carrier dynamics in sulfur-hyperdoped silicon studied by time-resolved terahertz spectroscopy Meng-Ju Sher, Christie Simmons, Austin Akey, Mark Winkler, Daniel Recht, Tonio Buonassisi, Michael Aziz, Aaron Lindenberg Preview Abstract

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Bulletin of the American Physical Society

APS March Meeting 2014

Volume 59, Number 1

Monday–Friday, March 3–7, 2014; Denver, Colorado

Session Index

Session G44: Focus Session: Defects in Semiconductors: Characterization

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