Bulletin of the American Physical Society
APS March Meeting 2013
Volume 58, Number 1
Monday–Friday, March 18–22, 2013; Baltimore, Maryland
Session T46: Focus Session: Advances in Scanned Probe Microscopy 1: Scanning Probe Spectroscopy & Novel Applications to C-based Systems
8:00 AM–11:00 AM,
Thursday, March 21, 2013
Hilton Baltimore
Room: Holiday Ballroom 5
Sponsoring
Unit:
GIMS
Chair: Alexander Otte, Delft University of Technology
Abstract ID: BAPS.2013.MAR.T46.9
Abstract: T46.00009 : Thermoelectric microscopy for imaging disorder in epitaxial graphene
10:00 AM–10:12 AM
Preview Abstract Abstract
Authors:
Sanghee Cho
(Korea Research Institute of Standards and Science)
Stephen Kang
(Korea Research Institute of Standards and Science)
Wondong Kim
(Korea Research Institute of Standards and Science)
Ho-Ki Lyeo
(Korea Research Institute of Standards and Science)
Eui-Sup Lee
(Korea Advanced Institute of Science and Technology)
Sung-Jae Woo
(Korea Advanced Institute of Science and Technology)
Yong-Hyun Kim
(Korea Advanced Institute of Science and Technology)
Ki-Jeong Kong
(Korea Research Institute of Chemical Technology)
Ilyou Kim
(Pohang University of Science and Technology)
Hyeong-Do Kim
(Pohang University of Science and Technology)
Tong Zhang
(National Institute of Standards and Technology)
Joseph Stroscio
(National Institute of Standards and Technology)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2013.MAR.T46.9
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