Thursday, March 21, 2013
8:00AM - 8:12AM
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T46.00001: A Josephson STM with two niobium tips
Anita Roychowdhury, Rami Dana, Michael Dreyer, James Robert Anderson, Christopher J. Lobb, Frederick C. Wellstood
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Thursday, March 21, 2013
8:12AM - 8:24AM
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T46.00002: Electron-Hole Asymmetries in the Locally Inverted $\alpha^2 F(\omega)$ Spectrum of a Conventional Superconductor by STM
Francis Niestemski, Steven Johnston, Alex Contryman, Charlie Camp, Tom Devereaux, Hari Manoharan
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Thursday, March 21, 2013
8:24AM - 8:36AM
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T46.00003: Intermodulation Spectroscopy applied to AFM
David Haviland, Daniel Platz, Daniel Forchheimer, Erik Thol\'en
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Thursday, March 21, 2013
8:36AM - 8:48AM
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T46.00004: Interaction imaging with amplitude-dependence force spectroscopy
Daniel Platz, Daniel Forchheimer, Erik Thol\'{e}n, David Haviland
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Thursday, March 21, 2013
8:48AM - 9:00AM
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T46.00005: Quantitative Atomic-Resolution Surface Force Field Spectroscopy in Three Dimensions: A {\it {How-To}} Guide for Collecting Meaningful Data
Mehmet Z. Baykara, Omur E. Dagdeviren, Todd C. Schwendemann, Harry M\"{o}nig, Eric I. Altman, Udo D. Schwarz
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Thursday, March 21, 2013
9:00AM - 9:12AM
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T46.00006: Virtual Scanning Tunneling Microscopy: A local spectroscopic probe of high mobility 2D electron systems
Matthew Pelliccione, John Bartel, Adam Sciambi, Loren Pfeiffer, Ken West, David Goldhaber-Gordon
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Thursday, March 21, 2013
9:12AM - 9:24AM
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T46.00007: Tuning 2D-2D tunneling in high mobility electron systems
John Bartel, Matthew Pelliccione, Adam Sciambi, Loren Pfeiffer, Ken West, David Goldhaber-Gordon
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Thursday, March 21, 2013
9:24AM - 10:00AM
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T46.00008: Gate Map Tunneling Spectroscopy of Interactions in Graphene
Invited Speaker:
Jungseok Chae
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Thursday, March 21, 2013
10:00AM - 10:12AM
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T46.00009: Thermoelectric microscopy for imaging disorder in epitaxial graphene
Sanghee Cho, Stephen Kang, Wondong Kim, Ho-Ki Lyeo, Eui-Sup Lee, Sung-Jae Woo, Yong-Hyun Kim, Ki-Jeong Kong, Ilyou Kim, Hyeong-Do Kim, Tong Zhang, Joseph Stroscio
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Thursday, March 21, 2013
10:12AM - 10:24AM
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T46.00010: Noise Analysis on Graphene Devices via Scanning Noise Microscopy
Duckhyung Cho, Moon Gyu Sung, Hyungwoo Lee, Kwang Heo, Kyung-Eun Byun, Taekyeong Kim, David H. Seo, Sunae Seo, Seunghun Hong
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Thursday, March 21, 2013
10:24AM - 10:36AM
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T46.00011: Electronic state of carbon material surface by non-contact scanning nonlinear dielectric microscopy
Shin-ichiro Kobayashi, Yasuo Cho
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Thursday, March 21, 2013
10:36AM - 10:48AM
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T46.00012: Contactless Probing of the Carrier Transport in Carbon Nanotubes Using Dielectric Force Microscopy
Yize Li, Jun Ge, Jia Liu, Jie Zhang, Wei Lu, Liwei Chen
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Thursday, March 21, 2013
10:48AM - 11:00AM
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T46.00013: Quantitative Kelvin Probe Force Microscopy of a Single-Walled Carbon Nanotube Transistor
Elliot Fuller, Brad Corso, Tolga Gul, Philip Collins
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