Bulletin of the American Physical Society
APS March Meeting 2012
Volume 57, Number 1
Monday–Friday, February 27–March 2 2012; Boston, Massachusetts
Session X1: Focus Session: Advances in Scanned Probe Microscopy IV: New Instrumentation & Techniques
2:30 PM–5:42 PM,
Thursday, March 1, 2012
Room: 203
Sponsoring
Unit:
GIMS
Chair: Alex de Lozanne, University of Texas at Austin
Abstract ID: BAPS.2012.MAR.X1.11
Abstract: X1.00011 : Micromolding fabrication of ``T'' cross section SiC SPM probes
4:30 PM–4:42 PM
Preview Abstract Abstract
Authors:
ChiaYun Wu
(Physics U. Mass Lowell)
Shihang Wang
(Plastics Eng U. mass Lowell)
Daniel Schmidt
(Plastics Eng U. mass Lowell)
Joel Therrien
(ECE U. Mass Lowell)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2012.MAR.X1.11
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