Bulletin of the American Physical Society
APS March Meeting 2012
Volume 57, Number 1
Monday–Friday, February 27–March 2 2012; Boston, Massachusetts
Session X1: Focus Session: Advances in Scanned Probe Microscopy IV: New Instrumentation & Techniques
2:30 PM–5:42 PM,
Thursday, March 1, 2012
Room: 203
Sponsoring
Unit:
GIMS
Chair: Alex de Lozanne, University of Texas at Austin
Abstract ID: BAPS.2012.MAR.X1.10
Abstract: X1.00010 : Reference system for scanning probe tip fingerprinting*
4:18 PM–4:30 PM
Preview Abstract Abstract
Authors:
Robert Turansky
(Institute of Physics, Slovak Academy of Sciences)
Joseph Bamidele
(Dept. of Physics, King's College London)
Yasuhiro Sugawara
(Dept. of Applied Physics, Osaka University)
Lev Kantorovitch
(Dept. of Physics, King's College London)
Ivan Stich
(Institute of Physics, Slovak Academy of Sciences)
*Financial support from APVT (ESF-EC-0007-07) under the Nanoparma ESF FANAS project is gratefully acknowledged. This researchwas supported in part byERDFOPR\&D, Project CE QUTE ITMS 26240120009, and via CE SAS QUTE.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2012.MAR.X1.10
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