Bulletin of the American Physical Society
APS March Meeting 2012
Volume 57, Number 1
Monday–Friday, February 27–March 2 2012; Boston, Massachusetts
Session T20: Invited Session: Advanced Characterization of Transistor Gate Stacks and Interfaces
2:30 PM–5:30 PM,
Wednesday, February 29, 2012
Room: 253C
Sponsoring
Unit:
FIAP
Chair: Chris Van Der Walle, University of California, Santa Barbara
Abstract ID: BAPS.2012.MAR.T20.3
Abstract: T20.00003 : Metropolis Prize Talk: Defects in Al$_{2}$O$_{3}$ and their impact on III-V/Al$_{2}$O$_{3}$ MOS-based devices
3:42 PM–4:18 PM
Preview Abstract Abstract
Author:
Justin R. Weber
(Intel Corporation, Hillsboro, OR)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2012.MAR.T20.3
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