APS March Meeting 2012
Volume 57, Number 1
Monday–Friday, February 27–March 2 2012;
Boston, Massachusetts
Session Index
Session T20: Invited Session: Advanced Characterization of Transistor Gate Stacks and Interfaces
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Sponsoring Units: FIAP
Chair: Chris Van Der Walle, University of California, Santa Barbara
Room: 253C
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Wednesday, February 29, 2012
2:30PM - 3:06PM
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T20.00001: Directions in High-k Gate Stacks: From Silicon Chips to Carbon Nanomaterials
Invited Speaker:
Matthew Copel
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Wednesday, February 29, 2012
3:06PM - 3:42PM
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T20.00002: Nanometer-scale properties of metal/oxide interfaces and ``end-on'' metal contacts to Si nanowires studied by ballistic electron emission microscopy (BEEM)
Invited Speaker:
Jon Pelz
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Wednesday, February 29, 2012
3:42PM - 4:18PM
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T20.00003: Metropolis Prize Talk: Defects in Al$_{2}$O$_{3}$ and their impact on III-V/Al$_{2}$O$_{3}$ MOS-based devices
Invited Speaker:
Justin R. Weber
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Wednesday, February 29, 2012
4:18PM - 4:54PM
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T20.00004: Charge Traps at and near High-K Oxide/III-V Interfaces
Invited Speaker:
Paul McIntyre
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Wednesday, February 29, 2012
4:54PM - 5:30PM
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T20.00005: Electrical characterization of interfacial defects
Invited Speaker:
Gennadi Bersuker
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