Bulletin of the American Physical Society
APS March Meeting 2012
Volume 57, Number 1
Monday–Friday, February 27–March 2 2012; Boston, Massachusetts
Session J24: Focus Session: Dopants and Defects in Semiconductors - Si and III-V
11:15 AM–2:15 PM,
Tuesday, February 28, 2012
Room: 256
Sponsoring
Unit:
DMP
Chair: Socrates Pantelides, Vanderbilt University
Abstract ID: BAPS.2012.MAR.J24.5
Abstract: J24.00005 : Segregation and diffusion of boron dopants in the Si/SiO$_2$ interface
12:03 PM–12:15 PM
Preview Abstract Abstract
Authors:
Young Jun Oh
(Department of Physics, Korea Advanced Institute of Science and Technology)
Hyeon-Kyun Noh
(Department of Physics, Korea Advanced Institute of Science and Technology)
Geun-myung Kim
(Department of Physics, Korea Advanced Institute of Science and Technology)
K.J. Chang
(Department of Physics, Korea Advanced Institute of Science and Technology)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2012.MAR.J24.5
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