Bulletin of the American Physical Society
APS March Meeting 2011
Volume 56, Number 1
Monday–Friday, March 21–25, 2011; Dallas, Texas
Session J37: Focus Session: Graphene Growth, Characterization, and Devices: Surface Studies
11:15 AM–2:15 PM,
Tuesday, March 22, 2011
Room: C146
Sponsoring
Unit:
DMP
Chair: Phil First, Georgia Institute of Technology
Abstract ID: BAPS.2011.MAR.J37.7
Abstract: J37.00007 : The effect of the tip in scanning tunneling spectroscopy of graphene Landau levels*
12:51 PM–1:03 PM
Preview Abstract Abstract
Authors:
Kevin Kubista
(Georgia Institute of Technology)
David Miller
(Georgia Institute of Technology)
Ming Ruan
(Georgia Institute of Technology)
Walt de Heer
(Georgia Institute of Technology)
Phillip First
(Georgia Institute of Technology)
Gregory Rutter
(NIST-Gaithersburg)
Joseph Stroscio
(NIST-Gaithersburg)
*Supported in part by NSF and NRI-INDEX
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2011.MAR.J37.7
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