Bulletin of the American Physical Society
APS March Meeting 2010
Volume 55, Number 2
Monday–Friday, March 15–19, 2010; Portland, Oregon
Session Q33: Focus Session: Complex Oxide Thin Films -- Oxide/Semiconductor Interfaces and Defects
11:15 AM–2:15 PM,
Wednesday, March 17, 2010
Room: E143
Sponsoring
Units:
DMP GMAG
Chair: Susanne Stemmer, University of California, Santa Barbara
Abstract ID: BAPS.2010.MAR.Q33.3
Abstract: Q33.00003 : In situ synchrotron measurements of surface compensation mechanisms in La$_{0.6}$Sr$_{0.4}$Co$_{0.2}$Fe$_{0.8}$O$_{3-\delta}$ thin films
12:03 PM–12:15 PM
Preview Abstract Abstract
Authors:
Tim Fister
(Argonne National Laboratory)
Stephan Hruszkewycz
(Argonne National Laboratory)
Dillon Fong
(Argonne National Laboratory)
Jeffrey Eastman
(Argonne National Laboratory)
Paul Fuoss
(Argonne National Laboratory)
Hui Du
(Carnegie Mellon University)
Paul Salvador
(Carnegie Mellon University)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2010.MAR.Q33.3
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