Bulletin of the American Physical Society
APS March Meeting 2010
Volume 55, Number 2
Monday–Friday, March 15–19, 2010; Portland, Oregon
Session Q20: Focus Session: Graphene: Local Probes
11:15 AM–2:15 PM,
Wednesday, March 17, 2010
Room: C120-122
Sponsoring
Unit:
DMP
Chair: Peter Johnson, Brookhaven National Laboratory
Abstract ID: BAPS.2010.MAR.Q20.6
Abstract: Q20.00006 : The Effect of a Lattice Defect on Graphene Landau Levels: A Scanning Tunneling Spectroscopy Study*
12:39 PM–12:51 PM
Preview Abstract
Abstract
Authors:
Kevin D. Kubista
(Georgia Institute of Technology)
David L. Miller
(Georgia Institute of Technology)
Ming Ruan
(Georgia Institute of Technology)
Walt A. de Heer
(Georgia Institute of Technology)
Phillip N. First
(Georgia Institute of Technology)
Gregory M. Rutter
(Center for Nanoscale Science and Technology, NIST)
Joseph A. Stroscio
(Center for Nanoscale Science and Technology, NIST)
*Work supported in part by NSF and NRI-INDEX.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2010.MAR.Q20.6
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