Bulletin of the American Physical Society
APS March Meeting 2010
Volume 55, Number 2
Monday–Friday, March 15–19, 2010; Portland, Oregon
Session P25: Focus Session: Dopants and Defects in Semiconductors - III-V's
8:00 AM–11:00 AM,
Wednesday, March 17, 2010
Room: D135
Sponsoring
Unit:
DMP
Chair: Volkmar Dierolf, Lehigh University
Abstract ID: BAPS.2010.MAR.P25.4
Abstract: P25.00004 : Measurement of [N] dependence of electron effective mass in GaAsN
8:36 AM–8:48 AM
Preview Abstract Abstract
Authors:
Tassilo Dannecker
(Tyndall National Institute)
Yu Jin
(Materials Science and Engineering, University of Michigan)
John Buckeridge
(Tyndall National Institute)
Ctirad Uher
(Physics Department, University of Michigan)
Cagliyan Kurdak
(Physics Department, University of Michigan)
Stephen Fahy
(Tyndall National Institute, Cork, Ireland)
Rachel S. Goldman
(Materials Science and Engineering, University of Michigan)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2010.MAR.P25.4
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