2009 APS March Meeting
Volume 54, Number 1
Monday–Friday, March 16–20, 2009;
Pittsburgh, Pennsylvania
Session Q5: Plasmonics in Future Electronics
11:15 AM–2:15 PM,
Wednesday, March 18, 2009
Room: 401/402
Sponsoring
Unit:
FIAP
Chair: Boris Luk`yanchuk, Agency for Science, Technology and Research
Abstract ID: BAPS.2009.MAR.Q5.1
Abstract: Q5.00001 : A Technique for Nanoscale Plasmonic Imaging via Photoemission
11:15 AM–11:51 AM
Preview Abstract
Abstract
Author:
Daniel S. Pickard
(Department of Electrical Engineering, National University of Singapore)
The scientific community is witnessing increased research activity on
Surface Plasmon Polaritons (SPPs). The potential applications of
SPPs and
plasmonic structures based on their control and manipulation are
truly
multi-disciplinary, spanning high speed nano-scale interconnects,
meta-materials, chemical and biological sensing, sub-wavelength
optics and
waveguides, near-field optical trapping, high-density data
storage, and the
enhancement of non-linear effects. Measurement of the localized
optical
field intensity is a critical component in validating physical
models and
characterizing plasmonic structures. The dominant technique
employed for
this task is the Scanning Near-Field Optical Microscope (SNOM) or
Photon
Scanning Tunneling Microscope (PSTM), whose contrast mechanism is
based on
measuring light scattered from the near-field with a probe. These
techniques can provide high resolution images of the localized
fields, but
they are slow. Furthermore, tip-sample interactions can perturb
the fields,
yielding ambiguity between electric and magnetic fields and
frustrating
attempts at accurate optical characterization. One way to
facilitate the
advance of plasmonics is to develop new techniques for imaging and
characterizing SPP behavior on the nanoscale. Recent efforts
employing
photoemission to reveal the localized fields have demonstrated
that this
technique can provide both high spatial ($\sim$10nm) and temporal
(fs) resolution
when combined with a Photoelectron Emission Microscope
(PEEM)[1-3]. The
PEEM does not require a probe so the fields can be imaged without
perturbation. It also provides a parallel image of the full
field, so
acquisition times are fast. We are expanding the capabilities of
the PEEM
to exploit a novel contrast mechanism which will broaden the
spectrum of
plasmonic devices observable. We present our experimental
efforts in this
area, detail the underlying physics of the contrast mechanism and
discuss
how it can be controlled to enable unique spatial and temporal
information
on the propagation of SPPs within plasmonic structures.
\\[4pt]
[1] M. Cinchetti, A. Gloskovskii, S. A. Nepjiko, G. Schonhense,
H. Rochholz
and M. Kreiter, PRL 95*, *047601 (2005)
\\[0pt]
[2] Atsushi Kubo, Ken Onda, Hrvoje Petek, Zhijun Sun, Yun S.
Jung, and Hong
Koo Kim, Nano Letters, 2005, Vol. 5, No. 6, 1123-1127
\\[0pt]
[3] M. Stockman, M. Kling, U. Kleineberg, F. Krausz, Nature
photonics, VOL
1, Sept 2007, 539-544
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2009.MAR.Q5.1