Bulletin of the American Physical Society
2009 APS March Meeting
Volume 54, Number 1
Monday–Friday, March 16–20, 2009; Pittsburgh, Pennsylvania
Session P27: Focus Session: Advances in Scanned Probe Microscopy III: High Frequency and Optical Techniques
8:00 AM–11:00 AM,
Wednesday, March 18, 2009
Room: 329
Sponsoring
Unit:
GIMS
Chair: Chris Hammel, Ohio State University
Abstract ID: BAPS.2009.MAR.P27.4
Abstract: P27.00004 : Ultrafast Stroboscopic Optical Interferometry of Nanoelectromechanical Devices in Damping Pressurized Gas Environment
9:00 AM–9:12 AM
Preview Abstract
Abstract
Authors:
O. Svitelskiy
V. Sauer
N. Liu
K.M. Cheng
M.R. Freeman
W.K. Hiebert
(University of Alberta Physics Dept and National Institute for Nanotechnology, Edmonton AB Canada)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2009.MAR.P27.4
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