High Speed Scanning Property Mapping ($>$1 frame per second)*

Atomic Force Microscopy is coupled with concepts of acoustics to achieve nanoscale property contrast at line scanning rates approaching several kHz. This allows novel measurements of surface dynamics, efficient large area imaging, and high throughput experiments with SPM. Examples for mechanical contrast on block copolymers, semiconductors, and eutectic alloys are included, as well as high speed electric and magnetic field imaging. Coupled electromechanical contrast (piezoelectric) is also employed with PZT thin films to uniquely monitor ferroelectric domain dynamics.