Bulletin of the American Physical Society
2009 APS March Meeting
Volume 54, Number 1
Monday–Friday, March 16–20, 2009; Pittsburgh, Pennsylvania
Session K1: Poster Session II (2-5:00pm): Education; SPS/Undergrad Research; Metals; Magnetism; Instrumentation and Measurements; Chemical Physics; Artificially Structured Materials; Surfaces, Interfaces and Thin Films; AMO Physics; Quantum Information; Bio Physics
2:00 PM,
Tuesday, March 17, 2009
Room: Exhibit Hall A
Abstract ID: BAPS.2009.MAR.K1.115
Abstract: K1.00115 : Image contrast dependence on the field emitter in near field emission scanning electron microscopy
Preview Abstract Abstract
Authors:
Olivier Scholder
(Swiss Federal Institute of Technology Zurich (ETHZ))
Taryl Kirk
(Swiss Federal Institute of Technology Zurich (ETHZ))
Lorenzo De Pietro
(Swiss Federal Institute of Technology Zurich (ETHZ))
Thomas Baehler
(Swiss Federal Institute of Technology Zurich (ETHZ))
Urs Ramsperger
(Swiss Federal Institute of Technology Zurich (ETHZ))
Danilo Pescia
(Swiss Federal Institute of Technology Zurich (ETHZ))
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2009.MAR.K1.115
Follow Us |
Engage
Become an APS Member |
My APS
Renew Membership |
Information for |
About APSThe American Physical Society (APS) is a non-profit membership organization working to advance the knowledge of physics. |
© 2024 American Physical Society
| All rights reserved | Terms of Use
| Contact Us
Headquarters
1 Physics Ellipse, College Park, MD 20740-3844
(301) 209-3200
Editorial Office
100 Motor Pkwy, Suite 110, Hauppauge, NY 11788
(631) 591-4000
Office of Public Affairs
529 14th St NW, Suite 1050, Washington, D.C. 20045-2001
(202) 662-8700