Bulletin of the American Physical Society

2008 APS March Meeting

Volume 53, Number 2

Monday–Friday, March 10–14, 2008; New Orleans, Louisiana

Session Index

Session Y6: Industrial Advanced Characterizations	Show Abstracts
Sponsoring Units: FIAP Chair: Mark Disko, Exxon Mobile Research and Engineering Co. Room: Morial Convention Center RO4

Friday, March 14, 2008 11:15AM - 11:51AM		Y6.00001: Local strain analysis for CMOS technology by Raman and Nano-Raman spectroscopy Invited Speaker: Preview Abstract
Friday, March 14, 2008 11:51AM - 12:27PM		Y6.00002: Hydrogen storage by physisorption on Metal Organic Frameworks Invited Speaker: Preview Abstract
Friday, March 14, 2008 12:27PM - 1:03PM		Y6.00003: Characterization of the pore geometry of porous media and the saturating fluids using 2-dimensional diffusion - NMR relaxation measurements Invited Speaker: Preview Abstract
Friday, March 14, 2008 1:03PM - 1:39PM		Y6.00004: Non- linear Optical Spectroscopy of Interfaces Invited Speaker: Preview Abstract
Friday, March 14, 2008 1:39PM - 2:15PM		Y6.00005: Development of Silicide Contacts for CMOS devices: Advantages of using Synchrotron Radiation Invited Speaker: Preview Abstract

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Bulletin of the American Physical Society

2008 APS March Meeting

Volume 53, Number 2

Monday–Friday, March 10–14, 2008; New Orleans, Louisiana

Session Index

Session Y6: Industrial Advanced Characterizations

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