Bulletin of the American Physical Society
2008 APS March Meeting
Volume 53, Number 2
Monday–Friday, March 10–14, 2008; New Orleans, Louisiana
Session V16: Focus Session: Medical Imaging and Related Technologies
11:15 AM–2:15 PM,
Thursday, March 13, 2008
Morial Convention Center
Room: 208
Sponsoring
Unit:
DBP
Chair: Christopher Njeh, Tyler Cancer Center
Abstract ID: BAPS.2008.MAR.V16.7
Abstract: V16.00007 : Inverse Participation Ratio (IPR) Analysis of Transmission Electron Microscopy (TEM) Images: Quantification of Optical Disorder Strength Due to Nanoscale Refractive Index Fluctuations of Tissues/Cells
1:39 PM–1:51 PM
Preview Abstract Abstract
Authors:
P. Pradhan
V. Turzhitsky
H. Subramanian
A. Heifetz
D. Damania
J. L. Hoogheem
M. J. Jung
H. K. Roy
V. Backman
(Northwestern University, Evanston, IL 60208)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2008.MAR.V16.7
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