Bulletin of the American Physical Society

2008 APS March Meeting

Volume 53, Number 2

Monday–Friday, March 10–14, 2008; New Orleans, Louisiana

Session Index

Session Q36: Focus Session: Advances in Scanned Probe Microscopy III: Force Methods	Show Abstracts
Sponsoring Units: GIMS Chair: Eric Hudson, IBM Room: Morial Convention Center 228

Wednesday, March 12, 2008 11:15AM - 11:51AM		Q36.00001: Three-Dimensional Force Imaging and Quantification with Atomic Resolution Invited Speaker: Preview Abstract
Wednesday, March 12, 2008 11:51AM - 12:03PM		Q36.00002: Tuning the instability in Static Mode Atomic Force Spectroscopy by applying electric field Soma Das, P.A. Sreeram, Arup K. Raychaudhuri Preview Abstract
Wednesday, March 12, 2008 12:03PM - 12:15PM		Q36.00003: Theoretical simulation of tapping mode AFM in water Masaru Tsukada, Naoki Watanabe Preview Abstract
Wednesday, March 12, 2008 12:15PM - 12:27PM		Q36.00004: Functional probes for scanning probe microscopy Yukio Hasegawa, Kotone Akiyama, Masayuki Hamada, Toyoaki Eguchi, Toshu An, Yasunori Fujikawa, Toshio Sakurai Preview Abstract
Wednesday, March 12, 2008 12:27PM - 12:39PM		Q36.00005: Fabrication of a NEMS Resonator Over-shield for Mass Sensing Vincent T.K. Sauer, Mark R. Freeman, Wayne K. Hiebert Preview Abstract
Wednesday, March 12, 2008 12:39PM - 12:51PM		Q36.00006: Ferromagnetic Resonance Investigation of an Individual Permalloy Dot Using Magnetic Resonance Force Microscopy J. Kim, I.H. Lee, D. Pelekhov, Yu. Obukhov, P. Banerjee, I. Martin, P. Wigen, P.C. Hammel Preview Abstract
Wednesday, March 12, 2008 12:51PM - 1:03PM		Q36.00007: Detecting Few Electron Spins by Magnetic Resonance Force Microscopy with Potential Application for Donor Mapping in Semiconductor Kin Chung Fong, Palash Banerjee, Yuri Oboukhov, Denis Pelekhov , P. Chris Hammel Preview Abstract
Wednesday, March 12, 2008 1:03PM - 1:15PM		Q36.00008: Force detected electron spin resonance from N@C$_{60}$ thin films Palash Banerjee, K.C. Fong, D.V. Pelekhov, P.C. Hammel Preview Abstract
Wednesday, March 12, 2008 1:15PM - 1:27PM		Q36.00009: Development of a $^3$He Nuclear Magnetic Resonance Force Microscope* Mark Monti, Han-Jong Chia, Yong Lee, John Markert Preview Abstract
Wednesday, March 12, 2008 1:27PM - 1:39PM		Q36.00010: NMR Force Microscopy on Co/Cu interface Yu. Obukhov, D. V. Pelekhov, P. Banerjee, J. Martindale, K. C. Fong, P. C. Hammel Preview Abstract
Wednesday, March 12, 2008 1:39PM - 1:51PM		Q36.00011: Micromagnetic Modeling of Localized Ferromagnetic Resonance Detected with Magnetic Resonance Force Microscopy Denis V. Pelekhov, Ivar Martin, Yuri Obukhov, Jongjoo Kim, Inhee Lee, Evgueni Nazaretski, Roman Movshovich, P. Chris Hammel Preview Abstract
Wednesday, March 12, 2008 1:51PM - 2:03PM		Q36.00012: Magnetic Resonance Force Microscopy System Design for the Study of Organic Materials Doran Smith Preview Abstract
Wednesday, March 12, 2008 2:03PM - 2:15PM		Q36.00013: Applications of scanning Kelvin probe microscopy in the characterization of photovoltaic materials and devices Chunsheng Jiang, Helio Moutinho, Mowafak Al-Jassim Preview Abstract

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Bulletin of the American Physical Society

2008 APS March Meeting

Volume 53, Number 2

Monday–Friday, March 10–14, 2008; New Orleans, Louisiana

Session Index

Session Q36: Focus Session: Advances in Scanned Probe Microscopy III: Force Methods

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