Wednesday, March 12, 2008
11:15AM - 11:51AM
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Q35.00001: Advanced SOI CMOS transistor technology for high performance microprocessors
Invited Speaker:
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Wednesday, March 12, 2008
11:51AM - 12:03PM
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Q35.00002: Elastically strained silicon/silicon dioxide nano-layers
Leonid Tsybeskov, Andrei Sirenko, David Lockwood, John McCaffrey
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Wednesday, March 12, 2008
12:03PM - 12:15PM
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Q35.00003: Electronic Structure of Conduction Bands in Strained Si Nanomembranes
C. Euaruksakul, Z. Li, C.S. Ritz, B. Tanto, D.M. Cottrill, M.-H. Huang, F. Chen, D.E. Savage, F. Liu, F.J. Himpsel, M.G. Lagally
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Wednesday, March 12, 2008
12:15PM - 12:27PM
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Q35.00004: Inelastic Electron Tunneling Spectroscopy Study of MOS Diodes Based on High-$\kappa $ Gate Dielectrics
S.L. You, C.C. Huang, C.J. Wang, H.C. Ho, J. Kwo, W.C. Lee, K.Y. Lee, Y.D. Wu, Y.J. Lee, M. Hong
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Wednesday, March 12, 2008
12:27PM - 12:39PM
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Q35.00005: On the role of Al doping at the SiO$_{2}$/HfO$_{2}$ interface
Onise Sharia, A.A. Demkov, G. Bersuker, B.H. Lee
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Wednesday, March 12, 2008
12:39PM - 12:51PM
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Q35.00006: Oxide charge and band alignments in Pt/epi-Lu$_{2}$O$_{3}$/Si (111) structures studied by Internal Photoemission and C-V measurements
W. Cai, J.P. Pelz, C. Adamo, D.G. Schlom
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Wednesday, March 12, 2008
12:51PM - 1:03PM
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Q35.00007: Electrical and optical properties of PtSi thin films
Hendrik Bentmann, A.A. Demkov, Stefan Zollner, Rich Gregory
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Wednesday, March 12, 2008
1:03PM - 1:15PM
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Q35.00008: \textit{Ab-initio} study of early stages of III-V epitaxy on Si : direct \textit{vs.} buffer deposition on vicinal surfaces
A.A. Demkov, Onise Sharia, Hendrik Bentmann
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Wednesday, March 12, 2008
1:15PM - 1:27PM
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Q35.00009: Atomic-layer-deposited HfO$_{2}$ on In$_{0.53}$Ga$_{0.47}$As -- passivation and energy-band parameters
Y.C. Chang, K.Y. Lee, M.L. Huang, Y.J. Lee, T.D. Lin, M. Hong, J. Kwo
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Wednesday, March 12, 2008
1:27PM - 1:39PM
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Q35.00010: Interfacial-layers-free Ga$_{2}$O$_{3}$(Gd$_{2}$O$_{3})$/Ge MOS Diodes
C.H. Lee, T.D. Lin, K.Y. Lee, M.L. Huang, L.T. Tung, M. Hong, J. Kwo
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Wednesday, March 12, 2008
1:39PM - 1:51PM
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Q35.00011: Aspect Ratio Study of Microstructures Formed using an Adaptable Photomask
Anna Fox, Adam Fontecchio
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Wednesday, March 12, 2008
1:51PM - 2:03PM
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Q35.00012: Characterization of surface and pore morphologies on nanoporous organosilicate films
Jeeun Kim, Heeju Lee, Sanghoon Song, Wonsuk Cha, Hyunjung Kim, Gunwoo Park, Sungkyu Min, Taehoon Lee, Heewoo Rhee, Gwangwoo Kim
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Wednesday, March 12, 2008
2:03PM - 2:15PM
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Q35.00013: Trap densities in porous low-k dielectric thin films as determined by optical and electrical measurements
Joanna Atkin, Daohua Song, Robert Laibowitz, Eduard Cartier, Thomas Shaw, Tony Heinz
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