Bulletin of the American Physical Society
2008 APS March Meeting
Volume 53, Number 2
Monday–Friday, March 10–14, 2008; New Orleans, Louisiana
Session L31: Graphene: Atomic Structure and Lattice Properties
2:30 PM–5:30 PM,
Tuesday, March 11, 2008
Morial Convention Center
Room: 223
Sponsoring
Unit:
DCMP
Chair: Dan Finkenstadt, Naval Research Laboratory
Abstract ID: BAPS.2008.MAR.L31.10
Abstract: L31.00010 : X-ray studies of the rotational fault distributions in multilayer graphene grown on the 4H-SiC$(000\bar{1})$ surface
4:18 PM–4:30 PM
Preview Abstract
Abstract
Authors:
J.E. Mill\'an
(Georgia Institute of Technology)
J. Hass
(Georgia Institute of Technology)
F. Varchon
(Institut Neel/CNRS)
W.A. deHeer
(Georgia Institute of Technology)
C. Berger
(Georgia Institute of Technology)
P.N. First
(Georgia Institute of Technology)
L. Magaud
(Institut Neel/CNRS)
E.H. Conrad
(Georgia Institute of Technology)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2008.MAR.L31.10
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