Bulletin of the American Physical Society
2008 APS March Meeting
Volume 53, Number 2
Monday–Friday, March 10–14, 2008; New Orleans, Louisiana
Session J30: Optical Properties and Experimental Characterization of Graphene and Related Structures
11:15 AM–2:15 PM,
Tuesday, March 11, 2008
Morial Convention Center
Room: 222
Sponsoring
Unit:
DMP
Chair: Marco Fornari, Central Michigan University
Abstract ID: BAPS.2008.MAR.J30.15
Abstract: J30.00015 : UHV electron-probing of micro-mechanically cleaved Graphene on SiO$_{2}$
2:03 PM–2:15 PM
Preview Abstract Abstract
Authors:
K.R. Knox
(Columbia University)
S. Wang
(Columbia University)
P. Kim
(Columbia University)
R.M. Osgood
(Columbia University)
T.O. Mentes
(Elettra Trieste Italy)
M.A.N Orti
(Elettra Trieste Italy)
A. Locatelli
(Elettra Trieste Italy)
D. Cvetko
(TASC-INFM Trieste Italy )
A. Morgante
(TASC-INFM Trieste Italy )
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2008.MAR.J30.15
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