Bulletin of the American Physical Society

2008 APS March Meeting

Volume 53, Number 2

Monday–Friday, March 10–14, 2008; New Orleans, Louisiana

Session Index

Session A36: Focus Session: X-ray and Electron Optics and Microscopy	Show Abstracts
Sponsoring Units: GIMS Chair: Timothy Graber, University of Chicago Room: Morial Convention Center 228

Monday, March 10, 2008 8:00AM - 8:36AM		A36.00001: Invited Speaker: Preview Abstract
Monday, March 10, 2008 8:36AM - 8:48AM		A36.00002: Optimal conditions for combining a transmission x-ray microscope with a grating interferometer Xianghui Xiao, Qun Shen Preview Abstract
Monday, March 10, 2008 8:48AM - 9:00AM		A36.00003: Consideration in the Reconstruction of 3D atomic Structure from X-Ray Yuhao Wang, J. Bai, T.A. Tyson, P. Siddons, G. De Geronimo Preview Abstract
Monday, March 10, 2008 9:00AM - 9:12AM		A36.00004: Synchrotron topographic studies of stacking faults in type-IIa diamond crystals XianRong Huang, Albert Macrander, Jozef Maj Preview Abstract
Monday, March 10, 2008 9:12AM - 9:24AM		A36.00005: Design, nanofabrication and testing of silicon and diamond hard X-ray optics A.F. Isakovic, A. Stein, J.B. Warren, K. Evans-Lutterodt, S. Narayanan, M. Sprung, A. Sandy Preview Abstract
Monday, March 10, 2008 9:24AM - 9:36AM		A36.00006: X-ray Reflectivity and Power Spectral Density of Smoothly Polished Silicon Lahsen Assoufid, Albert Macrander, Suresh Narayanan, Ruben Khachatryan, Sunil Sinha Preview Abstract
Monday, March 10, 2008 9:36AM - 9:48AM		A36.00007: Wide-angle incidence x-ray waveguides prepared by micro-/nano-technology using crystal surface diffraction Sung-Yu Chen, Yu-Chi Shen, Mau-Sen Chiu, Chia-Hung Chu, Yuriy P. Stetsko, Bo-Yuan Shew, Shih-Lin Chang Preview Abstract
Monday, March 10, 2008 9:48AM - 10:00AM		A36.00008: Fluctuation electron microscopy studies of complex structured materials Gongpu Zhao, Annick Roug\'ee, Peter Buseck, Michael Treacy Preview Abstract
Monday, March 10, 2008 10:00AM - 10:12AM		A36.00009: Holography with Low Energy Electrons - a New Tool for Structural Biology Tatiana Latychevskaia, Hans-Werner Fink Preview Abstract
Monday, March 10, 2008 10:12AM - 10:24AM		A36.00010: Theory of ultrafast electron diffraction: the role of the pulse properties. John Sipe, Ania Michalik, Eugene Sherman Preview Abstract
Monday, March 10, 2008 10:24AM - 10:36AM		A36.00011: Determination of Adsorbed C$_{60}$ Nanostructures by Low-Energy Electron Diffraction M.A. Van Hove, G.M. Gavaza, Z.X. Yu, G. Xu, S.Y. Tong, W.W. Pai, C.H. Lin Preview Abstract
Monday, March 10, 2008 10:36AM - 10:48AM		A36.00012: RHEED-TRAXS as a tool for in-situ stoichiometry control. Sandeep Chandril, Cameron Keenan, Thomas Myers, David Lederman Preview Abstract
Monday, March 10, 2008 10:48AM - 11:00AM		A36.00013: First background free measurement of the inelastic tail of the Auger electron spectrum down to 0 eV A. H. Weiss, S. Mukherjee, M.P. Nadesalingam, N. G. Fazleev Preview Abstract

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Bulletin of the American Physical Society

2008 APS March Meeting

Volume 53, Number 2

Monday–Friday, March 10–14, 2008; New Orleans, Louisiana

Session Index

Session A36: Focus Session: X-ray and Electron Optics and Microscopy

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