X-ray diffraction and reciprocal space mapping in ZnMnGaO$_{4}$ films with checkerboard nanostructures

Reciprocal space maps (RSM) in ZnMnGaO$_{4}$ films with checkerboard nanostructures were measured with the energy of the x-ray beam of 10.53 keV at the A2 beamline at Cornell High Energy Synchrotron Source (CHESS) using a four-circle diffractometer. Structural properties of the checkerboards, such as elastic strain, relaxation effects, twists, and tilts of the nanodomains, were analyzed using H-K, H-L, and K-L cross sections of the RSM's measured around various symmetric and asymmetric reflections (022), (004), (044), (226), (222) of the spinel structure. Work at Rutgers was supported by the DE-FG02-07ER46382 and the NSF-DMR- 0706326. Work at NJIT was supported by the NSF-DMR-0546985. The Cornell High Energy Synchrotron Source is supported by the NSF and the NIH/NIGMS under Award No. DMR-0225180.