Bulletin of the American Physical Society
2008 APS March Meeting
Volume 53, Number 2
Monday–Friday, March 10–14, 2008; New Orleans, Louisiana
Session B36: Focus Session: Advances in Scanned Probe Microscopy I: Low Temperatures
11:15 AM–1:39 PM,
Monday, March 10, 2008
Morial Convention Center
Room: 228
Sponsoring
Unit:
GIMS
Chair: Joseph A. Stroscio, National Institute of Standards and Technology
Abstract ID: BAPS.2008.MAR.B36.7
Abstract: B36.00007 : Absolute in-situ calibration piezoelectric quartz tuning fork force Sensors.
12:51 PM–1:03 PM
Preview Abstract Abstract
Authors:
Sanjay Bidasaria
(Georgia Tech)
Alexei Marchenkov
(Georgia Tech.)
Collaboration:
Marchenkov Group
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2008.MAR.B36.7
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